Method for determining the level of abnormality of an individual, in particular for the statistical detection of abnormal individuals in a multivariate context

Archimbaud, A., Ruiz, A. and Soual, C. (2026). Method for determining the level of abnormality of an individual, in particular for the statistical detection of abnormal individuals in a multivariate context (Japanese Patent No. JP, 7819102, B2). Japan Patent Office. Publication date: February 24, 2026.

Overview

The invention relates to a method for determining an abnormality level of an individual, in particular for statistically detecting abnormal individuals in a previously collected data set obtained from measurements of parameters of the individual acquired by a plurality of measurement systems, characterized in that it comprises: a step 100 of pre-processing the data, a step 200 of determining a multivariate abnormality index, said index being transformed by a function f so as to be comprised between 0 and 1 for a set of measurements for each individual, based on the pre-processed data, and a step 300 of identifying abnormal individuals.

Details
Posted on:
February 24, 2026
Length:
1 minute read, 136 words
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